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1

Development of the AASPIRE Web Accessibility Guidelines for Autistic Web Users

Raymaker, Dora M., Kapp, Steven K., McDonald, Katherine E., Weiner, Michael, Ashkenazy, Elesia, Nicolaidis, Christina

Journal:

Autism in Adulthood: Knowledge, Practice, and Policy

Year:

2019

Language:

english

File:

PDF, 371 KB

english, 2019

2

Double-Sampling Design Paradigm—A Compendium of Architectures

Nicolaidis, Michael

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2015

Language:

english

File:

PDF, 727 KB

english, 2015

3

The AASPIRE practice-based guidelines for the inclusion of autistic adults in research as co-researchers and study participants

Nicolaidis, Christina, Raymaker, Dora, Kapp, Steven K, Baggs, Amelia, Ashkenazy, E, McDonald, Katherine, Weiner, Michael, Maslak, Joelle, Hunter, Morrigan, Joyce, Andrea

Journal:

Year:

2019

Language:

english

File:

PDF, 120 KB

english, 2019

4

Foreword to the Special Section on “Design for Reliability and Yield for Ultimate CMOS Technologies”

Nicolaidis, Michael

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2015

Language:

english

File:

PDF, 27 KB

english, 2015

5

On-line testing for VLSI: state of the art and trends

Michael Nicolaidis

Journal:

Integration, the VLSI Journal

Year:

1998

Language:

english

File:

PDF, 127 KB

english, 1998

6

Memory Defect Tolerance Architectures for Nanotechnologies

Michael Nicolaidis, Lorena Anghel, Nadir Achouri

Journal:

Journal of Electronic Testing

Year:

2005

Language:

english

File:

PDF, 1.23 MB

english, 2005

7

CSL: Configurable Fault Tolerant Serial Links for Inter-die Communication in 3D Systems

Vladimir Pasca, Lorena Anghel, Michael Nicolaidis, Mounir Benabdenbi

Journal:

Journal of Electronic Testing

Year:

2012

Language:

english

File:

PDF, 716 KB

english, 2012

8

Update in Pain Medicine

Daniel P. Alford, Jane Liebschutz, Ian A. Chen, Christina Nicolaidis, Mukta Panda, Karina M. Berg, Jennifer Gibson, Michael Picchioni, Matthew J. Bair

Journal:

Journal of General Internal Medicine

Year:

2008

Language:

english

File:

PDF, 114 KB

english, 2008

9

Guest Editorial

Michael Nicolaidis, Rob Roy

Journal:

Journal of Electronic Testing

Year:

1999

Language:

english

File:

PDF, 8 KB

english, 1999

10

Guest Editorial

Dimitris Nikolos, John P. Hayes, Michael Nicolaidis, Cecilia Metra

Journal:

Journal of Electronic Testing

Year:

2002

Language:

english

File:

PDF, 26 KB

english, 2002

11

Simulating Single Event Transients in VDSM ICs for Ground Level Radiation

Dan Alexandrescu, Lorena Anghel, Michael Nicolaidis

Journal:

Journal of Electronic Testing

Year:

2004

Language:

english

File:

PDF, 254 KB

english, 2004

12

Vibroacoustic stimulation is not associated with sudden fetal catecholamine release

Nicholas M. Fisk, Peter K. Nicolaidis, Sabaratnam Arulkumaran, M.Walter Weg, Yuen Tannirandorn, Umberto Nicolini, Michael J. Parkes, Charles H. Rodeck

Journal:

Early Human Development

Year:

1991

Language:

english

File:

PDF, 529 KB

english, 1991

13

Obesity treatment by hypothalamic transplantation

Sergueï O. Fetissov, Stelianos Nicolaïdis, Michael M. Meguid

Journal:

Year:

2012

Language:

english

File:

PDF, 79 KB

english, 2012

14

[IEEE 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Vancouver, BC, Canada (2011.10.3-2011.10.5)] 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems - A Practical Approach to Single Event Transients Analysis for Highly Complex Designs

Alexandrescu, Dan, Costenaro, Enrico, Nicolaidis, Michael

Year:

2011

Language:

english

File:

PDF, 286 KB

english, 2011

15

Discordant blood flow velocity waveforms in left and right brachial arteries in growth-retarded fetuses

Waldo Sepulveda, Sarah Bower, Peter Nicolaidis, Michael de Swiet, Nicholas M. Fisk

Journal:

Obstetrics & Gynecology

Year:

1995

Language:

english

File:

PDF, 474 KB

english, 1995

16

[IEEE 2012 IEEE 18th International On-Line Testing Symposium (IOLTS 2012) - Sitges, Spain (2012.06.27-2012.06.29)] 2012 IEEE 18th International On-Line Testing Symposium (IOLTS) - Through-silicon-via built-in self-repair for aggressive 3D integration

Nicolaidis, Michael, Pasca, Vladimir, Anghel, Lorena

Year:

2012

Language:

english

File:

PDF, 754 KB

english, 2012

17

[IEEE 2011 16th IEEE European Test Symposium (ETS) - Trondheim, Norway (2011.05.23-2011.05.27)] 2011 Sixteenth IEEE European Test Symposium - I-BIRAS: Interconnect Built-In Self-Repair and Adaptive Serialization in 3D Integrated Systems

Nicolaidis, Michael, Pasca, Vladimir, Anghel, Lorena

Year:

2011

Language:

english

File:

PDF, 118 KB

english, 2011

18

[IEEE 2010 9th IEEE International Symposium on Network Computing and Applications (NCA) - Cambridge, MA, USA (2010.07.15-2010.07.17)] 2010 Ninth IEEE International Symposium on Network Computing and Applications - Fault-Tolerant Deadlock-Free Adaptive Routing for Any Set of Link and Node Failures in Multi-cores Systems

Chaix, Fabien, Avresky, Dimiter, Zergainoh, Nacer-Eddine, Nicolaidis, Michael

Year:

2010

Language:

english

File:

PDF, 638 KB

english, 2010

19

Using Error Correcting Codes Without Speed Penalty in Embedded Memories: Algorithm, Implementation and Case Study

Thierry Bonnoit, Michael Nicolaidis…

Journal:

Journal of Electronic Testing

Year:

2013

Language:

english

File:

PDF, 630 KB

english, 2013

20

[IEEE 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - Chania (2013.7.8-2013.7.10)] 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - Variability-aware and fault-tolerant self-adaptive applications for many-core chips

Bizot, Gilles, Chaix, Fabien, Zergainoh, Nacer-Eddine, Nicolaidis, Michael

Year:

2013

Language:

english

File:

PDF, 244 KB

english, 2013

21

[Frontiers in Electronic Testing] Soft Errors in Modern Electronic Systems Volume 41 ||

Nicolaidis, Michael

Year:

2011

Language:

english

File:

PDF, 5.82 MB

english, 2011

22

[IEEE 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - Chania (2013.7.8-2013.7.10)] 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - Fault-tolerant adaptive routing under permanent and temporary failures for many-core systems-on-chip

Dimopoulos, Michael, Yi Gang,, Benabdenbi, Mounir, Anghel, Lorena, Zergainoh, Nacer-Eddine, Nicolaidis, Michael

Year:

2013

Language:

english

File:

PDF, 916 KB

english, 2013

23

Fault-tolerant adaptive routing under an unconstrained set of node and link failures for many-core systems-on-chip

Dimopoulos, Michael, Gang, Yi, Anghel, Lorena, Benabdenbi, Mounir, Zergainoh, Nacer-Eddine, Nicolaidis, Michael

Journal:

Microprocessors and Microsystems

Year:

2014

Language:

english

File:

PDF, 3.18 MB

english, 2014

24

“We’ve Not Gotten Even Close to What We Want to Do”: a Qualitative Study of Early Patient-Centered Medical Home Implementation

Tuepker, Anaïs, Kansagara, Devan, Skaperdas, Eleni, Nicolaidis, Christina, Joos, Sandra, Alperin, Michael, Hickam, David

Journal:

Journal of General Internal Medicine

Year:

2014

Language:

english

File:

PDF, 266 KB

english, 2014

25

[IEEE 2014 19th IEEE European Test Symposium (ETS) - Paderborn, Germany (2014.5.26-2014.5.30)] 2014 19th IEEE European Test Symposium (ETS) - A generic and high-level model of large unreliable NoCs for fault tolerance and performance analysis

Chaix, Fabien, Zergainoh, Nacer-Eddine, Nicolaidis, Michael

Year:

2014

Language:

english

File:

PDF, 433 KB

english, 2014

26

[IEEE 2011 IEEE 17th International On-Line Testing Symposium (IOLTS 2011) - Athens, Greece (2011.07.13-2011.07.15)] 2011 IEEE 17th International On-Line Testing Symposium - Variability-aware task mapping strategies for many-cores processor chips

Chaix, Fabien, Bizot, Gilles, Nicolaidis, Michael, Zergainoh, Nacer-Eddine

Year:

2011

Language:

english

File:

PDF, 532 KB

english, 2011

27

[IEEE 2011 16th IEEE European Test Symposium (ETS) - Trondheim, Norway (2011.05.23-2011.05.27)] 2011 Sixteenth IEEE European Test Symposium - Efficient Fault Detection Architecture Design of Latch-Based Low Power DSP/MCU Processor

Yu, Hai, Nicolaidis, Michael, Anghel, Lorena, Zergainoh, Nacer-Eddine

Year:

2011

File:

PDF, 316 KB

2011

28

[IEEE 37th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN'07) - Edinburgh, UK (2007.06.25-2007.06.28)] 37th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN'07) - Workshop on Dependable and Secure Nanocomputing

Arlat, Jean, Iyer, Ravishankar K., Nicolaidis, Michael

Year:

2007

Language:

english

File:

PDF, 158 KB

english, 2007

29

[IEEE Conference Publications Design Automation and Test in Europe - Grenoble, France (2013.03.18-2013.03.22)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013 - Reliability Challenges of Real-Time Systems in Forthcoming Technology Nodes

Hamdioui, Said, Gizopoulos, Dimitris, Guido, Groeseneken, Nicolaidis, Michael, Grasset, Arnaud, Bonnot, Philippe

Year:

2013

Language:

english

File:

PDF, 605 KB

english, 2013

30

[IEEE 2011 IEEE 17th International On-Line Testing Symposium (IOLTS 2011) - Athens, Greece (2011.07.13-2011.07.15)] 2011 IEEE 17th International On-Line Testing Symposium - Memory BIST with address programmability

Fradi, Aymen, Nicolaidis, Michael, Anghel, Lorena

Year:

2011

Language:

english

File:

PDF, 207 KB

english, 2011

31

[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - Double-sampling architectures

Nicolaidis, Michael

Year:

2014

Language:

english

File:

PDF, 283 KB

english, 2014

32

[IEEE 2011 IEEE 10th International Symposium on Network Computing and Applications (NCA) - Cambridge, MA, USA (2011.08.25-2011.08.27)] 2011 IEEE 10th International Symposium on Network Computing and Applications - Self-Recovering Parallel Applications in Multi-core Systems

Bizot, Gilles, Avresky, Dimiter, Chaix, Fabien, Zergainoh, Nacer-Eddine, Nicolaidis, Michael

Year:

2011

Language:

english

File:

PDF, 332 KB

english, 2011

33

[IEEE 2013 18th IEEE European Test Symposium (ETS) - Avignon, France (2013.05.27-2013.05.30)] 2013 18TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - Reducing power dissipation in memory repair for high defect densities

Papavramidou, Panagiota, Nicolaidis, Michael

Year:

2013

Language:

english

File:

PDF, 627 KB

english, 2013

34

[IEEE 2013 IEEE 31st VLSI Test Symposium (VTS) - Berkeley, CA (2013.4.29-2013.5.2)] 2013 IEEE 31st VLSI Test Symposium (VTS) - Hot topic session 4A: Reliability analysis of complex digital systems

Evans, Adrian, Nicolaidis, Michael, Aitken, Rob, Aktan, Burcin, Lauzeral, Olivier

Year:

2013

Language:

english

File:

PDF, 58 KB

english, 2013

35

[IEEE Technology (ICICDT) - Grenoble, France (2010.06.2-2010.06.4)] 2010 IEEE International Conference on Integrated Circuit Design and Technology - Design techniques for soft-error mitigation

Nicolaidis, Michael

Year:

2010

Language:

english

File:

PDF, 399 KB

english, 2010

36

[IEEE 2008 14th IEEE International On-Line Testing Symposium (IOLTS) - Rhodes, Greece (2008.07.7-2008.07.9)] 2008 14th IEEE International On-Line Testing Symposium - Special Session 2: Benchmarking and Standardization in Software-Based SER Characterization: Towards an IEEE Task Force?

Nicolaidis, Michael

Year:

2008

Language:

english

File:

PDF, 195 KB

english, 2008

37

[IEEE 13th IEEE International On-Line Testing Symposium (IOLTS 2007) - Crete, Greece (2007.07.8-2007.07.11)] 13th IEEE International On-Line Testing Symposium (IOLTS 2007) - GRAAL: A Fault-Tolerant Architecture for Enabling Nanometric Technologies

Nicolaidis, Michael

Year:

2007

Language:

english

File:

PDF, 84 KB

english, 2007

38

[IEEE 2008 IEEE International Conference on Dependable Systems and Networks With FTCS and DCC (DSN) - Anchorage, AK (2008.06.24-2008.06.27)] 2008 IEEE International Conference on Dependable Systems and Networks With FTCS and DCC (DSN) - Second workshop on dependable and secure nanocomputing

Arlat, Jean, Constantinescu, Cristian, Iyer, Ravishankar K., Nicolaidis, Michael

Year:

2008

Language:

english

File:

PDF, 403 KB

english, 2008

39

[IEEE 2013 18th IEEE European Test Symposium (ETS) - Avignon, France (2013.05.27-2013.05.30)] 2013 18TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - Variability-aware and fault-tolerant self-adaptive applications for many-core chips

Bizot, Gilles, Chaix, Fabien, Zergainoh, Nacer-Eddine, Nicolaidis, Michael

Year:

2013

Language:

english

File:

PDF, 102 KB

english, 2013

40

[IEEE 2012 IEEE 18th International On-Line Testing Symposium (IOLTS 2012) - Sitges, Spain (2012.06.27-2012.06.29)] 2012 IEEE 18th International On-Line Testing Symposium (IOLTS) - RIIF - Reliability information interchange format

Evans, Adrian, Nicolaidis, Michael, Wen, Shi-Jie, Alexandrescu, Dan, Costenaro, Enrico

Year:

2012

Language:

english

File:

PDF, 219 KB

english, 2012

41

[IEEE 2014 IEEE 13th International Symposium on Network Computing and Applications (NCA) - Cambridge, MA, USA (2014.8.21-2014.8.23)] 2014 IEEE 13th International Symposium on Network Computing and Applications - Congestion-Aware Adaptive Routing in 2D-Mesh Multicores

Avresky, Dimiter, Chaix, Fabien, Nicolaidis, Michael

Year:

2014

Language:

english

File:

PDF, 381 KB

english, 2014

42

New Techniques for SET Sensitivity and Propagation Measurement in Flash-Based FPGAs

Evans, Adrian, Alexandrescu, Dan, Ferlet-Cavrois, Veronique, Nicolaidis, Michael

Journal:

IEEE Transactions on Nuclear Science

Year:

2014

Language:

english

File:

PDF, 1.23 MB

english, 2014

43

[IEEE 2009 10th International Symposium on Quality of Electronic Design (ISQED) - San Jose, CA, USA (2009.03.16-2009.03.18)] 2009 10th International Symposium on Quality of Electronic Design - An effective approach to detect logic soft errors in digital circuits based on GRAAL

Yu, Hai, Nicolaidis, Michael, Anghel, Lorena

Year:

2009

Language:

english

File:

PDF, 187 KB

english, 2009

44

[IEEE 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - Chania (2013.7.8-2013.7.10)] 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - Transparent BIST for ECC-based memory repair

Nicolaidis, Michael, Papavramidou, Panagiota

Year:

2013

Language:

english

File:

PDF, 146 KB

english, 2013

45

[IEEE 2008 9th International Conference on Solid-State and Integrated-Circuit Technology (ICSICT) - Beijing, China (2008.10.20-2008.10.23)] 2008 9th International Conference on Solid-State and Integrated-Circuit Technology - Design trends and challenges of logic soft errors in future nanotechnologies circuits reliability

Hai Yu,, Fan, Xiaoya, Nicolaidis, Michael

Year:

2008

Language:

english

File:

PDF, 1.17 MB

english, 2008

46

[IEEE 2007 IEEE International Test Conference - Santa Clara, CA, USA (2007.10.21-2007.10.26)] 2007 IEEE International Test Conference - GRAAL: a new fault tolerant design paradigm for mitigating the flaws of deep nanometric technologies

Nicolaidis, Michael

Year:

2007

Language:

english

File:

PDF, 432 KB

english, 2007

47

[IEEE 2012 IEEE 30th VLSI Test Symposium (VTS) - Maui, HI, USA (2012.04.23-2012.04.25)] 2012 IEEE 30th VLSI Test Symposium (VTS) - Test algorithms for ECC-based memory repair in nanotechnologies

Papavramidou, Panagiota, Nicolaidis, Michael

Year:

2012

Language:

english

File:

PDF, 386 KB

english, 2012

48

[IEEE 2011 IEEE 29th International Conference on Computer Design (ICCD 2011) - Amherst, MA, USA (2011.10.9-2011.10.12)] 2011 IEEE 29th International Conference on Computer Design (ICCD) - Towards a tool for implementing delay-free ECC in embedded memories

Bonnoit, Thierry, Nicolaidis, Michael, Zergainoh, Nacer-Eddine

Year:

2011

Language:

english

File:

PDF, 977 KB

english, 2011

49

[IEEE Networks (DSN) - Chicago, IL, USA (2010.06.28-2010.07.1)] 2010 IEEE/IFIP International Conference on Dependable Systems & Networks (DSN) - Fourth workshop on dependable and secure nanocomputing

Arlat, Jean, Constantinescu, Cristian, Iyer, Ravishankar K., Karlsson, Johan, Nicolaidis, Michael

Year:

2010

Language:

english

File:

PDF, 126 KB

english, 2010

50

[IEEE Networks (DSN) - Lisbon, Portugal (2009.06.29-2009.07.2)] 2009 IEEE/IFIP International Conference on Dependable Systems & Networks - Third workshop on dependable and secure nanocomputing

Arlat, Jean, Constantinescu, Cristian, Iyer, Ravishankar K., Karlsson, Johan, Nicolaidis, Michael

Year:

2009

Language:

english

File:

PDF, 157 KB

english, 2009

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